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Tue 10 Nov 2020 01:41 - 01:42 at Virtual room 1 - ML Testing 1

Recent effort to test deep learning systems has produced an intuitive and compelling test criterion called neuron coverage (NC), which resembles the notion of traditional code coverage. NC measures the proportion of neurons activated in a neural network and it is implicitly assumed that increasing NC improves the quality of a test suite. In an attempt to automatically generate a test suite that increases NC, we design a novel diversity promoting regularizer that can be plugged into existing adversarial attack algorithms. We then assess whether such attempts to increase NC could generate a test suite that (1) detects adversarial attacks successfully, (2) produces natural inputs, and (3) is unbiased to particular class predictions. Contrary to expectation, our extensive evaluation finds that increasing NC actually makes it harder to generate an effective test suite: higher neuron coverage leads to fewer defects detected, less natural inputs, and more biased prediction preferences. Our results invoke skepticism that increasing neuron coverage may not be a meaningful objective for generating tests for deep neural networks and call for a new test generation technique that considers defect detection, naturalness, and output impartiality in tandem.

Tue 10 Nov
Times are displayed in time zone: (UTC) Coordinated Universal Time change

01:30 - 01:32
Talk
Correlations between Deep Neural Network Model Coverage Criteria and Model Quality
Research Papers
Shenao YanRutgers University, USA, Guanhong TaoPurdue University, USA, Xuwei LiuPurdue University, USA, Juan ZhaiRutgers University, USA, Shiqing MaRutgers University, USA, Lei XuNanjing University, China, Xiangyu ZhangPurdue University
DOI
01:33 - 01:34
Talk
Deep Learning Library Testing via Effective Model GenerationACM SIGSOFT Distinguished Paper Award
Research Papers
Zan WangTianjin University, China, Ming YanTianjin University, China, Junjie ChenTianjin University, China, Shuang LiuTianjin University, China, Dongdi ZhangTianjin University, China
DOI
01:35 - 01:36
Talk
Detecting Numerical Bugs in Neural Network ArchitecturesACM SIGSOFT Distinguished Paper Award
Research Papers
Yuhao ZhangPeking University, Luyao RenPeking University, China, Liqian ChenNational University of Defense Technology, China, Yingfei XiongPeking University, Shing-Chi CheungHong Kong University of Science and Technology, China, Tao XiePeking University
DOI
01:37 - 01:38
Talk
Dynamic Slicing for Deep Neural Networks
Research Papers
Ziqi ZhangPeking University, China, Yuanchun LiMicrosoft Research, China, Yao GuoPeking University, Xiangqun ChenPeking University, Yunxin LiuMicrosoft Research, China
DOI
01:39 - 01:40
Talk
Grammar Based Directed Testing of Machine Learning Systems
Journal First
Sakshi UdeshiSingapore University of Technology and Design, Sudipta ChattopadhyaySingapore University of Technology and Design
01:41 - 01:42
Talk
Is Neuron Coverage a Meaningful Measure for Testing Deep Neural Networks?
Research Papers
Fabrice Harel-CanadaUniversity of California at Los Angeles, USA, Lingxiao WangUniversity of California at Los Angeles, USA, Muhammad Ali GulzarUniversity of California at Los Angeles, USA, Quanquan GuUniversity of California at Los Angeles, USA, Miryung KimUniversity of California at Los Angeles, USA
DOI
01:43 - 01:44
Talk
Operational Calibration: Debugging Confidence Errors for DNNs in the Field
Research Papers
Zenan LiNanjing University, China, Xiaoxing MaNanjing University, China, Chang XuNanjing University, China, Jingwei XuNanjing University, China, Chun CaoNanjing University, China, Jian LuNanjing University, China
DOI
01:45 - 02:00
Talk
Conversations on ML Testing 1
Research Papers
Fabrice Harel-CanadaUniversity of California at Los Angeles, USA, Ming YanTianjin University, China, Sakshi UdeshiSingapore University of Technology and Design, Shenao YanRutgers University, USA, Yuhao ZhangPeking University, Zenan LiNanjing University, China, Ziqi ZhangPeking University, China, M: Hamid BagheriUniversity of Nebraska-Lincoln, USA