Mutant selection refers to the problem of choosing, among a large number of mutants, the (few) ones that should be used by the testers. In view of this, we investigate the problem of selecting the fault revealing mutants, i.e., the mutants that are killable and lead to test cases that uncover unknown program faults. We formulate two variants of this problem: the fault revealing mutant selection and the fault revealing mutant prioritization. We argue and show that these problems can be tackled through a set of `static’ program features and propose a machine learning approach, named FaRM, that learns to select and rank killable and fault revealing mutants.
Experimental results involving 1,692 real faults show the practical benefits of our approach in both examined problems. Our results show that FaRM achieves a good trade-off between application cost and effectiveness (measured in terms of faults revealed). We also show that FaRM outperforms all the existing mutant selection methods, i.e., the random mutant sampling, the selective mutation and defect prediction (mutating the code areas pointed by defect prediction). In particular, our results show that with respect to mutant selection, our approach reveals 23% to 34% more faults than any of the baseline methods, while, with respect to mutant prioritization, it achieves higher average percentage of revealed faults with a median difference between 4% and 9% (from the random mutant orderings).
Fri 13 NovDisplayed time zone: (UTC) Coordinated Universal Time change
08:00 - 08:30 | |||
08:00 2mTalk | Baital: An Adaptive Weighted Sampling Approach for Improved t-wise Coverage Research Papers Eduard Baranov Université Catholique de Louvain, Belgium, Axel Legay Université Catholique de Louvain, Belgium, Kuldeep S. Meel National University of Singapore, Singapore DOI | ||
08:03 1mResearch paper | Cost Measures Matter for Mutation Testing Study Validity Research Papers Giovani Guizzo University College London, UK, Federica Sarro University College London, UK, Mark Harman University College London, UK DOI Pre-print | ||
08:05 1mTalk | Developing and Evaluating Objective Termination Criteria for Random Testing Journal First Porfirio Tramontana Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Italy, Domenico Amalfitano University of Naples Federico II, Nicola Amatucci Department of Civil, Architectural and Environmental Engineering, University of Naples Federico II, Italy, Atif Memon Apple Inc., Anna Rita Fasolino Federico II University of Naples | ||
08:07 1mTalk | Efficient Binary-Level Coverage Analysis Research Papers M. Ammar Ben Khadra TU Kaiserslautern, Germany, Dominik Stoffel TU Kaiserslautern, Germany, Wolfgang Kunz TU Kaiserslautern, Germany DOI Pre-print Media Attached | ||
08:09 1mTalk | Efficiently Finding Higher-Order Mutants Research Papers Chu-Pan Wong Carnegie Mellon University, USA, Jens Meinicke Carnegie Mellon University, USA, Leo Chen Carnegie Mellon University, USA, João Paulo Diniz Federal University of Minas Gerais, Brazil, Christian Kästner Carnegie Mellon University, USA, Eduardo Figueiredo Federal University of Minas Gerais, Brazil DOI | ||
08:11 1mTalk | Selecting Fault Revealing Mutants Journal First Thierry Titcheu Chekam University of Luxembourg (SnT), Mike Papadakis University of Luxembourg, Luxembourg, Tegawendé F. Bissyandé University of Luxembourg, Luxembourg, Yves Le Traon University of Luxembourg, Luxembourg, Koushik Sen University of California at Berkeley | ||
08:13 17mTalk | Conversations on Testing 3 Paper Presentations Chu-Pan Wong Carnegie Mellon University, USA, Eduard Baranov Université Catholique de Louvain, Belgium, Giovani Guizzo University College London, UK, M. Ammar Ben Khadra TU Kaiserslautern, Germany, Porfirio Tramontana Department of Electrical Engineering and Information Technologies, University of Naples Federico II, Italy, Thierry Titcheu Chekam University of Luxembourg (SnT), M: Marcel Böhme Monash University, Australia |